Twelve terms that make any article about chipmaking easier to read.
- Nanometre (nm)
- A billionth of a metre. A human hair is about 70,000 nm across; a silicon atom about 0.2 nm.
- Wavelength
- The size of a light wave, which sets how fine a line it can draw. Deep-UV is 193 nm; EUV is 13.5 nm.
- Numerical aperture (NA)
- How wide a cone of light the optics can gather. Higher NA resolves finer detail: 0.33 in today's EUV tools, 0.55 in High-NA.
- Multilayer mirror
- Around forty pairs of molybdenum and silicon layers that reflect EUV light by interference, since no single surface can.
- Intermediate focus
- The point where the light source's beam converges and hands over to the scanner. Source power is quoted here.
- Reticle (mask)
- One layer's pattern, drawn four times larger, on a reflective glass plate. A chip needs a set of them, one per layer.
- Pellicle
- A membrane about 50 nm thick, stretched in front of the mask so that particles land out of focus instead of printing.
- Photoresist
- The light-sensitive film on the wafer. Exposed, then developed into a stencil that guides the etch or deposition step.
- Overlay
- How precisely each layer lands on the layers below: within a nanometre or two on a current machine.
- Stochastics
- Randomness in how few EUV photons land in a tiny feature, which can leave a line too fat or a hole unopened.
- Multiple patterning
- Splitting one layer across several masks when a single exposure can't resolve it. EUV mostly removes the need.
- Throughput
- Wafers exposed per hour: about 220 for the latest low-NA scanners, the number that sets a fab's output.